We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Leak Depth Analysis.
ipros is IPROS GMS IPROS One of the largest technical database sites in Japan that collects information on.

Leak Depth Analysis(sims) - List of Manufacturers, Suppliers, Companies and Products

Leak Depth Analysis Product List

1~1 item / All 1 items

Displayed results

Depth analysis of oxygen leaks

Introducing the analysis results of a sample where boron was ion-implanted into silicon using SIMS.

Impurity analysis is important in material development, and secondary ion mass spectrometry (SIMS), which can perform high-sensitivity analysis, is suitable for this purpose. Here, we present the results of analyzing a sample in which boron was ion-implanted into silicon at an energy of 3 keV using SIMS (ULVAC: ADEPT-1010). It is particularly evident that the depth profile of boron can be accurately analyzed due to oxygen leakage. *For more details, please refer to the PDF document or feel free to contact us.*

  • others

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration